This is the Final Project Report for the ANU Project, Driving Increased Efficiency and Reliability in Silicon Photovoltaics – From Ingots to Modules.
This project has developed new techniques and tools to identify the most important loss and degradation mechanisms in industrial silicon photovoltaic technology, extending along the value chain from silicon ingots, wafers, cells and through to the final modules. A focus of the project has been the development of rapid and accurate inspection tools based on luminescence, in conjunction with BT Imaging, an Australian metrology company that services the global PV industry. A key outcome here has been the development of innovative new methods for rapid module inspection and fault detection in-the-field, without the need for electrical isolation. We have also worked closely with Jinko Solar, one of the largest manufacturers of PV modules worldwide, to develop and apply new methods for improving their ingots, wafers and cells, and to demonstrate high efficiency solar cells on these materials with industrially-compatible processing. The project also supported collaboration with Fraunhofer ISE in Germany and the National Renewable Energy Laboratory in the USA, to explore new possibilities for improved characterisation of silicon materials and solar cells. The project has resulted in several exciting new methods for wafer, cell and module inspection, the most promising of which will continue to be progressed towards full commercialisation after completion of the project.